Morgan Hill, CA – May 23, 2017 –Anritsu Company introduces the Universal Fixture Extraction (UFX)option for its VectorStar® vector network analyzers (VNAs) to provide signal integrity and on-wafer engineers with an increased range of on-wafer and fixture calibration choices, even when a full set of calibration standards is not available. Developed to address the design challenges associated with the high-frequency, high data rate requirements of 4G and emerging 5G systems, as well as backhaul and data centers, UFX features unique analysis toolsso engineers can more accurately and efficiently evaluate designs.
VectorStar VNAs configured with UFX provide signal integrity and on-wafer engineers with multiple benefits. The VNA solution speeds time to market by enhancing model accuracy through improved test fixture de-embedding thereby improving first time yields. It also provides engineers with the ability to develop high-speed data throughput products with competitive advantages.
Fully corrected test fixture calibration techniques require a complete set of calibration standards at both ends of the fixture transmission path. In environments where a complete set of calibration standards are not available, the traditional method is to assume that both paths of the fixture are perfectly symmetrical and with perfect match. Since this is atypical, using previous techniques result in substantial de-embedding errors. The UFX option provides advanced de-embedding tools, allowing engineers to incrementally add calibration standards and characteristic data as they become available, for improved fixture extraction accuracy.
To aid in analyzing isolated defects within the test fixture, aSequential Peeling feature is included in UFX, as well. Signal integrity engineers can generate a .sNp file for a portion of a fixture, such as those found in transitions, based on phase function matching. This function provides more detailed information about the fixture, granting an opportunity to more easily improve the test fixture design.
UFX expands the industry-leading capability of VectorStar to conduct on-wafer device characterization, as well as high-speed data transfer measurements. Anritsu’s premium VNA line, VectorStar utilizes patented NLTL technology to offer the broadest coverage, 70 kHz to 145 GHz, in a single instrument. The VNAs bring the level of performance necessary for R&D engineers to accurately and reliably model high-frequency devices, to verify state-of-the-art designs, and to maximize throughput without sacrificing accuracy.