Keysight, Marvin Test Solutions Collaborate to Speed Manufacturing of mmWave Semiconductors

Keysight Technologies’ collaboration with Marvin Test Solutions, Inc. (MTS) has resulted in the development of a fast and accurate 5G semiconductor manufacturing test platform.

The two parties focused on advancing beamformer integrated circuit (IC) test technology to help manufacturers of semiconductors accelerate the production of high performance 5G integrated ICs. Marvin integrated Keysight’s PXIe-based Vector Network Analyzer (VNA) to achieve accurate and fast measurements in its TS-960e-5G mmWave Test System.

Keysight’s recently introduced M980xA Series network analyzers offer the scalability required to test multi-port components, front end modules (FEMs) and base stations that rely on beamforming technology. Mobile operators are deploying beamforming technology to extend cellular coverage and deliver higher data rates, leading to improved mmWave 5G network reliability and efficiency. To ensure reliable and efficient 5G mmWave communications, the performance of critical elements that form part of the beamformer IC need to be rigorously tested under linear and nonlinear conditions across the entire workflow from design, validation to manufacturing.

Thanks to Keysight’s proprietary measurement science and expertise in beamforming IC test technology, MTS can offer leading semiconductor manufacturers the ability to improve their production yield at a significantly reduced cost,” said Major General Stephen T. Sargeant, USAF (Ret.), CEO of Marvin Test Solutions. “Keysight’s highly scalable PXIe-based VNAs, when combined with MTS’ scalable, open architecture mmWave test platform and ATEasy® software development suite, offer the measurement performance highly sought after by our customers and enables us to simplify testing for global manufacturing organizations.”