Rohde & Schwarz highlights its comprehensive embedded systems test solutions at embedded world 2026

Embedded Test Solutions at embedded world 2026:

Embedded systems are fundamental to modern electronics, encompassing everything from power input and control PCBs to motors, sensors and user interfaces. Each of these comes with its own testing needs to guarantee optimal performance, reliability and a fast market release of the final product. At embedded world 2026, Rohde & Schwarz will highlight its comprehensive portfolio of advanced test solutions, addressing these critical needs, from the earliest stages of development to compliance and certification through to final production.

Rohde & Schwarz will present its advanced test and measurement solutions for the embedded industry at embedded world Exhibition & Conference in Nuremberg, Germany. Visitors can find the T&M expert at booth 4-218 in hall 4 of the Nuremberg Exhibition Center from March 10 to 12, 2026. There, they can delve into the company’s innovations designed to help engineers enhance device energy efficiency, expedite EMC compliance within the design process, speed up digital protocols debugging, and meet required regulatory standards for wireless interfaces.

Next generation oscilloscopes

At embedded world, Rohde & Schwarz will showcase its ever-growing range of next-generation oscilloscopes, from R&S MXO 3 to R&S MXO 5 , all powered by the same next-generation MXO-EP ASIC technology from Rohde & Schwarz, originally introduced with the R&S MXO 4 in 2022. The latest addition, the compact MXO 3, comes with up to eight channels and offers a combination of features that rival higher-class oscilloscopes, such as a real-time capture rate of up to 99% and hardware-accelerated functionality on math, spectrum and zone trigger.

Ensuring reliability in power electronics

Combined with high voltage, current and optically isolated probes (R&S RT-ZISO), the eight-channel models of MXO 3 and MXO 5 extend their capabilities to power electronics applications. For power conversion, the instruments’ eight channels and 18-bit HD mode provide critical visibility into complex systems like motor drives and inverters, enabling precise measurements for efficiency and optimization. Furthermore, they simplify power sequencing analysis with simultaneous multi-channel observation and deep memory of up to 500 Mpts, enabling longer recording durations and precise analysis of small signal events. Additionally, their fast spectrum analysis capability makes them excellent tools for quickly identifying EMI issues and noise sources.

EMI testing for embedded systems

Every electronic product and component is likely to emit conducted or radiated electromagnetic emissions. Especially for densely packed embedded systems, early debugging helps to isolate and correct EMI issues and accelerates time-to-market. As a leader in EMC testing, Rohde & Schwarz will present solutions that integrate EMI testing into the product design process. Visitors can learn how to use the R&S EPL1007 EMI test receiver in fast, accurate and reliable EMI pre-compliance and compliance measurements up to a frequency range of 7.125 GHz. The instrument offers device developers and conformance test houses the flexibility to upgrade with evolving needs – from preselection, including a preamplifier, up to a full CISPR 16-1-1 compliant test receiver.

Verifying signal integrity of digital designs

All hardware elements on a board layout are potential causes of signal degradation. To test the signal integrity on a PCB, Rohde & Schwarz will showcase its R&S ZNB3000 vector network analyzer at embedded world covering up to 40 GHz. This VNA, part of the new midrange family offering instruments with a maximum frequency range of up to 54 GHz, has redefined the standard for speed, precision and versatility with its industry-leading dynamic range, fast measurement speed, and scalable upgrades, perfectly suited for signal integrity applications. Visitors can experience the instrument’s advanced de-embedding techniques, which facilitate characterizing the test fixture, extracting the S-parameters and de-embedding the test fixture in a user-friendly manner, with the signal quality visualized by a simulated eye diagram.

Testing of high-speed interfaces

High-speed digital interfaces are integral to electronic designs, with increasing data rates and integration density posing new challenges at the IC, board and system level. Trade show visitors will learn at the Rohde & Schwarz booth about powerful signal integrity test tools for system verification, debugging, and compliance testing for different high-speed busses. Rohde & Schwarz will showcase for example 1GBASE-T Ethernet compliance testing using the R&S RTO6 oscilloscope and related equipment to ensure that a 1 Gigabit Ethernet (1GbE) physical layer (PHY) transceiver meets the specifications outlined in the IEEE 802.3 standard. In a different setup, Rohde & Schwarz will showcase its R&S RTP164B oscilloscope for signal integrity testing on a multitude of standards, including DDR5 and USB3.2.

When it comes to automotive interfaces, the emerging standards including Automotive Ethernet, OpenGMSL™ or ASA (Automotive SerDes Alliance) bring new challenges for design. Rohde & Schwarz already supports all of these new standards and will showcase comprehensive validation using the R&S RTP164B oscilloscope, featuring signal integrity debugging and automated compliance on ASA, as well as protocol decoding of 10Base-T1S to ensure robust and reliable link performance.

Battery life testing

Battery life is critical for battery-powered devices. Rohde & Schwarz will demonstrate in real time how the features of smart devices affect their power consumption. The setup is based on the R&S NGU source measure unit emulating a battery. The integrated analysis tool captures and visualizes current across sleep-to-active transitions. In another application on battery testing with the R&S NGM202, cells will be charged and discharged to characterize battery behavior and build accurate battery models.

Wireless connectivity testing

Embedded systems increasingly incorporate wireless connectivity as core function. Thorough testing is essential to ensure reliable performance, interoperability and compliance with industry standards. The complexity of these standards requires specialized test equipment and expertise. The CMP180 radio communication tester from Rohde & Schwarz contains two analyzers, two generators and two sets of eight RF ports in a single box and supports many cellular and non-cellular technologies across R&D, pre conformance and mass production. At embedded world, visitors will experience the CMP180 testing both Bluetooth® LE and Wi-Fi 8 devices.

The platform already supports physical layer testing for the new Bluetooth LE Channel Sounding and new Bluetooth LE High Data Throughput (HDT) feature, a cornerstone for the next generation of Bluetooth Low Energy (LE), offering increased capacity, better energy efficiency, improved spectrum efficiency and enhanced reliability. Wi-Fi 8, based on the IEEE 802.11bn standard, sets new expectations for consistent, ultra-high-reliability and quality connectivity. Designed to support a growing number of connected devices and demanding applications like XR and industrial IoT, the CMP180 helps engineers navigate the technical complexities of 802.11bn throughout the entire device lifecycle in non-signaling mode with its advanced capabilities and broad bandwidth support.

Efficient production lines with tailored solutions

For production tests at component, module and system level, Rohde & Schwarz will showcase a rack-mounted test and measurement configuration, featuring the rack-optimized R&S MXO 5C oscilloscopes and the PVT360A performance vector tester. This setup will demonstrate how tailored Rohde & Schwarz test solutions contribute to a production environment built for reliable validation, streamlined workflows and maximized throughput.

These and other test solutions for the embedded industry can be found at the Rohde & Schwarz booth 4-218 in hall 4 at the embedded world Exhibition & Conference from March 10 to 12, 2026 in Nuremberg, Germany.

For further information visit: www.rohde-schwarz.com/embedded-world