PEMTRON X-ray Wafer Inspection Technology – PEMTRON, an inspection equipment developer and supplier, will be exhibiting at SEMICON Southeast Asia 2026 (Booth No. 1101), where the company will highlight several of its latest inspection technologies developed for semiconductor and advanced electronics manufacturing.
At the show, PEMTRON will feature a focused lineup that includes MARS, 8800WIR, and JUPITER—systems designed to give manufacturers better visibility into their processes, improve defect detection, and support tighter control across critical production steps.
The 8800WIR Helios Wafer Inspection System combines advanced 2D and 3D imaging technologies to inspect a wide range of bump structures, including micro bumps. Designed for early-stage defect detection, the system helps identify quality issues before they impact subsequent manufacturing processes. By detecting small and difficult-to-find defects at the wafer level, 8800WIR supports improved yield and product consistency.
The JUPITER 3D X-ray Inspection System provides both 3D and 2D inspection using PCT reconstruction-based processing. The system integrates high-resolution imaging with PEMTRON’s AOI defect detection algorithms to support in-line process monitoring and process analysis. JUPITER also enables data sharing with SPI and AOI systems, giving manufacturers clearer insight into process trends and production stability.
For memory modules, PEMTRON will feature the MARS Automated Visual Inspection (AVI) System. Designed for high-volume environments, MARS delivers fast, consistent inspection using advanced image processing to detect defects without compromising throughput or inspection accuracy.
Attendees are invited to visit PEMTRON at Booth No. 1101 during SEMICON Southeast Asia, May 5–7, to learn more about its inspection technologies and speak with experts about optimizing inspection strategies for semiconductor and electronics manufacturing.
For more information about PEMTRON, please visit www.pemtron.com.
