Wireless Test Platform for Wi-Fi 7 launched by Keysight
Turnkey solution simulates Wi-Fi devices and traffic to cover new use cases on the latest IEEE 802.11be standardsDelivers signaling radio frequency and...
VIAVI Will Showcase Solutions to Optimize Networks In The Age of AI and The...
Viavi Solutions announced that it will be showcasing network test, automation and optimization solutions powered by NITRO Wireless and NITRO AIOps at MWC Barcelona, February 26-29, 2024.
Rohde & Schwarz collaborates with Sony Semiconductor Israel to reach milestones for NTN NB-IoT...
Rohde & Schwarz and Sony Semiconductor Israel (Sony) have achieved the industry’s first 3GPP Rel. 17 NTN NB-IoT RF performance verification. They...
Quantifi Photonics launches QCA Series High-Speed Communication Analyzer at DesignCon 2024
Quantifi Photonics, a leading photonics test and measurement instrument manufacturer, is launching the QCA Series High-Speed Communication Analyzer at DesignCon 2024.The QCA...
element14 Broadens Test and Measurement Offerings with Keysight in Asia Pacific
element14 announces the addition of Keysight, a leading test and measurement equipment provider for electronic design, e-mobility, network monitoring, 5G, LTE, IoT,...
Anritsu with ASUS to Validate IEEE 802.11be (Wi-Fi 7) 320 MHz RF Performance Testing
Anritsu and ASUS have announced a partnership to validate the latest wireless communications standard, IEEE 802.11be (Wi-Fi 7) 320 MHz performance testing....
Anritsu, Sony Semiconductor Israel, Validates Industry’s First Non-Terrestrial Network NB-IoT test case in CAG76
Anritsu Corporation is pleased to announce that the first NTN NB-IoT Protocol Conformance Tests for have been validated on the 5G NR...
Spirent and Anritsu collaborate to deliver comprehensive Automotive Test Solutions
Spirent Communications announced a strategic partnership with Anritsu to enable the automotive industry to more efficiently meet the unique testing requirements presented...
Applus and Rohde & Schwarz seamlessly integrate eCall testing in EMC test environments
Applus Laboratories and Rohde & Schwarz have successfully showcased the seamless integration of eCall testing in an electromagnetic compatibility (EMC) test environment....
Dark Field Wafer Defect Inspection System for High Throughput and High-Precision
Hitachi High-Tech Corporation launched the Hitachi Dark Field Wafer Defect Inspection System DI4600 – a new tool for inspecting particles and defects...