Langer E1 Immunity Development System – Saelig Company, Inc. announces the Langer E1 Immunity Development System for EMI investigations in printed circuit boards and electronic modules, detecting burst and ESD sensitivities, and checking the effect of EMC measures. The E1 is a set of EMC tools that can simulate interference processes when testing an electronic product. Disturbance currents, electric and magnetic fields can be injected directly into the electronic modules in different ways to determine the susceptible structures on the circuit board, understand the coupling mechanism and enable the implementation of optimum modifications if needed. The E1 Set includes a Burst Generator; three magnetic field sources for localizing weak spots in a layout; five E-Field sources for testing sensitive weak areas; a magnetic field probe; and an Optical Sensor Digital Probe for nonreactive transmissions of binary signals out of the DUT.
Developers can use the E1 set to quickly identify the results of burst and ESD interference. This allows the developer to design suitable measures to solve the causes of the interference. It can also be used to test the effectiveness of the measures taken. The E1 test set-up is small and fits easily on a developer’s desk. The E1 set user manual describes EMC mechanisms and provides detailed descriptions of basic measuring strategies for interference suppression in printed circuit boards. The E1 set includes a generator to generate burst and ESD disturbances.
The main problem with failed EMC tests is that the electronics behave like a ‘black box’. A disturbance may enter the electronics at a specific point, but the internal effects that lead to the failure are not visible. Testing at the earliest opportunity helps troubleshooting and analysis before compliance tests fail. The E1 set can create local burst and ESD disturbances, enabling developers to effectively address and mitigate specific interference issues during the development phase. The differential output of the burst generator allows engineers to inject disturbance currents into specific areas of the electronics. This is helpful for initially identifying areas of the circuitry that are not subject to failures and can reduce the complexity of the test setup. Then the field sources of the E1 set can be used to target and localize weak spots, right down to the pin level of IC’s.
Electric or magnetic field sources are crucial for evaluating the electromagnetic compatibility of electronic assemblies. Traditionally, this process begins with low-resolution sources that influence broad areas and identify general fault zones. However, pinpointing exact issues within these zones has required higher resolution sources that deliver precise, concentrated field beams. That is why the E1 Immunity System has been designed to streamline this process by integrating a comprehensive set of focused, localized tools for EMI investigations.
Also supplied with the E1 set is a user manual that thoroughly covers EMC mechanisms and provides detailed instructions on basic measuring strategies for interference suppression in PCBs.
The E1 solution is very affordable when compared to the cost of conventional testing equipment and the rates charged by test labs. Short video https://youtu.be/KumxcMY1vuk?si=zRudrzbozGt-of8d
The Langer EMV-Technik E1 Immunity Development System is made in Germany by Langer EMV, a world leader in PCB Immunity and Emission testing.
For more information, visit www.saelig.com.
