PEMTRON X-ray Inspection and Metrology Systems – PEMTRON, an inspection equipment developer and supplier, will exhibit at the JPCA Show 2026, taking place June 10–12 at Tokyo Big Sight in Tokyo, Japan. Visitors can find PEMTRON at Booth No. 1A-14.
At the show, PEMTRON will highlight its JUPITER 3D X-ray Inspection System, designed to support both 2D and 3D inspection using PCT reconstruction-based processing. The system combines high-resolution imaging with AOI defect detection algorithms, allowing manufacturers to monitor processes in-line while also gaining deeper insight into production trends.
JUPITER also enables data sharing with SPI and AOI systems, giving users a more connected view of their inspection data and helping identify variations across the production line.
In addition, PEMTRON will present its POSEIDON metrology system, which focuses on precise measurement of wafer warpage, flatness, and FC-BGA bump coplanarity. These measurements are critical for advanced packaging processes, including wire bonding and Micro LED applications.
POSEIDON also detects fine surface defects such as microcracks, missing bumps, and bridging, allowing manufacturers to catch issues earlier and maintain tighter process control before downstream assembly steps.
By showcasing both inspection and metrology solutions, PEMTRON is focusing on giving manufacturers better visibility into their processes—from early-stage wafer analysis through final inspection.
For more information visit: www.pemtron.com.
