GL Announces Enhanced Voice Quality Testing Solutions
GL Communications Inc., announced today its enhanced Voice Quality Testing solutions that include the important enhancements introduced to Voice Quality Testing software version 7.0,...
Rohde & Schwarz showcases its latest oscilloscope portfolio highlights at PCIM 2017
Munich, May 4, 2017 -- One of the highlights at the Rohde & Schwarz booth at PCIM 2017 in Nuremberg will be the new...
HBM EXHIBIT AT OFFSHORE WIND ENERGY 2017
HBM – a leader in the field of test and measurement – will once again be exhibiting its latest range of revolutionarily measurement systems,...
5G Smart Bandages will track your health, send results to your doctor
Ever look at a bandage dressing and wonder why it can’t be smarter? Probably not, but for the few of you who do, a...
Triveni, Verance Partner On 3.0 Watermark
Triveni Digital and with Verance Corp. are working together to integrate Verance Aspect, a key component of the ATSC 3.0 television standard that broadcasters...
New R&S TS-290 IoT carrier acceptance test system from Rohde & Schwarz facilitates IoT...
Munich, April 20, 2017 -- The Global Semiconductor Alliance (GSA) estimates that more than 75 billion devices will be networked worldwide by the year...
New Tektronix Arbitrary Waveform Generator Meets Demanding Signal Generation Needs In Advanced Research, Radar/EW...
Tektronix, Inc., a leading worldwide provider of test, measurement and monitoring solutions, today introduced a new arbitrary waveform generator (AWG) that offers high signal...
Harting Introduces New Top Performer Ix Industrial 2.0 As The New Ethernet Standard Interface
Ethernet is the undisputed dominant communication standard and is penetrating ever more areas of our lives globally. The classic, globally popular RJ45 connector is...
CyberOptics to Present Yield-Improving Measurement Methods for Semiconductor Fabs at Photomask Japan
CyberOptics will present two technical posters reviewing yield-improving measurement methods for Airborne Particles and Relative Humidity (RH) in semiconductor fabs at the Photomask Japan...
Accel-RF Announces New High Voltage Switching Test System
Accel-RF Instruments announced the release of its new High Voltage Switching Test System at the CS International show in Brussels, Belgium earlier this month....
