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Test and measurement news from electronics industry

NTN NB-IoT

Rohde & Schwarz collaborates with Sony Semiconductor Israel to reach milestones for NTN NB-IoT...

Rohde & Schwarz and Sony Semiconductor Israel (Sony) have achieved the industry’s first 3GPP Rel. 17 NTN NB-IoT RF performance verification. They...
High-Speed Communication Analyzer

Quantifi Photonics launches QCA Series High-Speed Communication Analyzer at DesignCon 2024

Quantifi Photonics, a leading photonics test and measurement instrument manufacturer, is launching the QCA Series High-Speed Communication Analyzer at DesignCon 2024.The QCA...
element14 Broadens Test and Measurement Offerings with Keysight in Asia Pacific

element14 Broadens Test and Measurement Offerings with Keysight in Asia Pacific

element14 announces the addition of Keysight, a leading test and measurement equipment provider for electronic design, e-mobility, network monitoring, 5G, LTE, IoT,...

Anritsu with ASUS to Validate IEEE 802.11be (Wi-Fi 7) 320 MHz RF Performance Testing

Anritsu and ASUS have announced a partnership to validate the latest wireless communications standard, IEEE 802.11be (Wi-Fi 7) 320 MHz performance testing....
Christophe Flechelle, GM France & System Engineering Director at Sony Semiconductor Israel

Anritsu, Sony Semiconductor Israel, Validates Industry’s First Non-Terrestrial Network NB-IoT test case in CAG76

Anritsu Corporation is pleased to announce that the first NTN NB-IoT Protocol Conformance Tests for have been validated on the 5G NR...
Spirent Wi Fi 7 Testing

Spirent and Anritsu collaborate to deliver comprehensive Automotive Test Solutions

Spirent Communications announced a strategic partnership with Anritsu to enable the automotive industry to more efficiently meet the unique testing requirements presented...
The functionality of the eCall system was tested with a vehicle in the Applus EMC test hall

Applus and Rohde & Schwarz seamlessly integrate eCall testing in EMC test environments

Applus Laboratories and Rohde & Schwarz have successfully showcased the seamless integration of eCall testing in an electromagnetic compatibility (EMC) test environment....
Wafer Defect Inspection System

Dark Field Wafer Defect Inspection System for High Throughput and High-Precision

Hitachi High-Tech Corporation launched the Hitachi Dark Field Wafer Defect Inspection System DI4600 – a new tool for inspecting particles and defects...
Spirent Wi Fi 7 Testing

Financial Services Leader Selects Spirent Test Lab Automation

Spirent Communications, the leading provider of test and assurance solutions for next-generation devices and networks, today announced it has signed an agreement...
VIAVI XhaulAdvisor

VIAVI Accelerates O-RAN Interoperability Testing with Industry’s First Real-Time Analyzer

Viavi Solutions today announced the expansion of its NITRO Wireless portfolio with the addition of XhaulAdvisor, a scalable software solution offering real-time...

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