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Test and measurement news from electronics industry

Anritsu with ASUS to Validate IEEE 802.11be (Wi-Fi 7) 320 MHz RF Performance Testing

Anritsu and ASUS have announced a partnership to validate the latest wireless communications standard, IEEE 802.11be (Wi-Fi 7) 320 MHz performance testing....
Christophe Flechelle, GM France & System Engineering Director at Sony Semiconductor Israel

Anritsu, Sony Semiconductor Israel, Validates Industry’s First Non-Terrestrial Network NB-IoT test case in CAG76

Anritsu Corporation is pleased to announce that the first NTN NB-IoT Protocol Conformance Tests for have been validated on the 5G NR...
Spirent Wi Fi 7 Testing

Spirent and Anritsu collaborate to deliver comprehensive Automotive Test Solutions

Spirent Communications announced a strategic partnership with Anritsu to enable the automotive industry to more efficiently meet the unique testing requirements presented...
The functionality of the eCall system was tested with a vehicle in the Applus EMC test hall

Applus and Rohde & Schwarz seamlessly integrate eCall testing in EMC test environments

Applus Laboratories and Rohde & Schwarz have successfully showcased the seamless integration of eCall testing in an electromagnetic compatibility (EMC) test environment....
Wafer Defect Inspection System

Dark Field Wafer Defect Inspection System for High Throughput and High-Precision

Hitachi High-Tech Corporation launched the Hitachi Dark Field Wafer Defect Inspection System DI4600 – a new tool for inspecting particles and defects...
Spirent Wi Fi 7 Testing

Financial Services Leader Selects Spirent Test Lab Automation

Spirent Communications, the leading provider of test and assurance solutions for next-generation devices and networks, today announced it has signed an agreement...
VIAVI XhaulAdvisor

VIAVI Accelerates O-RAN Interoperability Testing with Industry’s First Real-Time Analyzer

Viavi Solutions today announced the expansion of its NITRO Wireless portfolio with the addition of XhaulAdvisor, a scalable software solution offering real-time...
Anritsu

Anritsu & University of Texas at Dallas Collaborate to Showcase End-to-End Test System for...

Anritsu Corporation, in collaborating with the University of Texas at Dallas, showcases the OpenROADM at the Supercomputing Conference 23 (SC23) on November...
Chipset Testing for Pre Silicon Verification

Spirent and Cadence Collaborate to bring Advanced Chipset Testing

Spirent Communications, the leading provider of test and assurance solutions for next-generation devices and networks, today announced a collaboration with Cadence Design...
R&S MXO 5

Rohde & Schwarz Enhances Next-Gen Oscilloscopes with Eight-Channel R&S MXO 5 for Increased Versatility

R&S MXO 5 - Next-Gen Oscilloscopes with Eight-Channel With the all-new R&S MXO 5 , Rohde & Schwarz...

Interview